Microgyroscope for determining rotational motions about at least one of three perpendicular spatial axes

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United States of America Patent

PATENT NO 8904866
APP PUB NO 20120055248A1
SERIAL NO

13319234

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Abstract

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A microgyroscope is used to determine rotational motions about at least one of three perpendicular spatial axes x, y, and z. The microgyroscope has a substrate (1) on which multiple masses (2x, 2y, 9) which oscillate parallel to the plane of the substrate (1) in an x-y plane are situated. Some of the oscillating masses (2x, 2y) are attached to the substrate (1) by means of springs and anchorings. Drive elements (4a, 4b) are used to maintain oscillating vibrations of the masses (2x, 2y, 9) which are subjected to Coriolis forces when the substrate (1) rotates about any given spatial axis. Sensor elements detect the deflections of the masses (2x, 2y, 9) due to the Coriolis forces generated. Some of the oscillating masses are x masses (2x) which are also deflectable along the z axis perpendicular to the substrate (1), by means of which they are able to detect yaw rates about the x axis, and/or some of the oscillating masses are y masses (2y) which are also deflectable along the z axis perpendicular to the substrate (1), by means of which they are able to detect yaw rates about the y axis, and/or others of the oscillating masses are z masses (9) which are also deflectable in the x-y plane, but perpendicular to their respective drive direction, by means of which they are able to detect yaw rates about the z axis.

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Patent Owner(s)

Patent OwnerAddress
HANKING ELECTRONICS HONGKONG CO LIMITEDFLAT/RM A 12/F ZJ 300 LOCKHART ROAD WAN CHAI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hammer, Hanno Graz-Lebring, AT 7 127

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