Probe card for testing a semiconductor chip
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United States of America Patent
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Dec 2, 2014
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N/A
app pub date -
Jun 1, 2012
filing date -
Jun 2, 2011
priority date (Note) -
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Abstract
There is provided a probe card comprising a plurality of probe tips, each being ball-shaped or pillar-shaped and having a top end in contact with each of target chip pads to be tested; a first space converting unit; a second space converting unit; a frame configured to support the second space converting unit; an interposer unit; and a circuit board.
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