Data-driven noise reduction technique for analog to digital converters
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United States of America Patent
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Nov 25, 2014
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Jan 24, 2014
filing date -
Jan 25, 2013
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Abstract
A successive operation register (SAR) analog-to-digital converter (ADC) circuit includes a bit reliability circuit that detects a delay time of the voltage comparator and, if the detected delay time is greater than a delay threshold time τMV, outputs a bit reliability decision signal; a digital noise reduction circuit that is selectively activated if the bit reliability decision signal indicates the detected delay time is greater than the delay threshold time τMV and produces a noise-reduced decision output that supersedes the decision output of the voltage comparator. In a preferred embodiment, the digital noise reduction circuit uses a multiple voting logic to produce a majority vote value as the noise-reduced decision output.
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