Data measurement methods and systems

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United States of America Patent

PATENT NO 8892380
SERIAL NO

12509219

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Abstract

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Methods are described for measuring data in a test setup including an impedance tuner. In an exemplary embodiment, the data is data for measuring noise parameters. The data is measured versus a sweep parameter for one tuner state at a time.

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Patent Owner(s)

Patent OwnerAddress
MAURY MICROWAVE INC2900 INLAND EMPIRE BLVD ONTARIO CA 91764

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Simpson, Gary R Fontana, US 27 287

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