Method and apparatus for current limit test for high power switching regulator
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United States of America Patent
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Nov 11, 2014
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app pub date -
Sep 17, 2013
filing date -
Mar 12, 2013
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Abstract
A method can reuse at least one pin in demultiplexing (demuxing) a voltage from a pin. The method can be used to set an accurate current limit threshold in a design for test (DFT) phase and, thus, to accurately set a trimming code of a current limiter. The method uses the property that a power MOSFET has almost a same conductive resistance at a large drain current. Thus, the current limit threshold can be set according to an accurate drain-to-source voltage Vds at a small current sink that is less than a maximum current that ATE is able to provide. An accurate voltage Vds can be measured through Kelvin sensing drain and source pins of the power MOSFET, which are connected to a current sense circuit.
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