Method and apparatus for in situ preparation of serial planar surfaces for microscopy
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United States of America Patent
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Nov 4, 2014
Grant Date -
Jul 4, 2013
app pub date -
Jan 18, 2013
filing date -
Sep 7, 2010
priority date (Note) -
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status (Latency Note)
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Abstract
Systems and methods for preparing solid samples for analysis, such as microscopic examination in cross section or planimetric orientation. The sample preparation systems may include a sample support configured to secure a solid sample, an excitation beam source that generates an excitation beam configured to remove material from a surface of the sample, a beam shield configured to at least partially protect the sample from the excitation beam, and a beam shield holder configured to secure the beam shield, where the adjustment of the relative positions of the beam shield and sample holder permits the excitation beam to selectively expose a series of substantially planar surfaces of the sample.
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International Classification(s)
- H01J:ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- B82Y:SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; ....
- G21K:TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNET....
- B23K:SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLA....
- G01N:INVESTIGATING OR ANALYSING MATERIALS BY DETERMININ....
- G01Q:SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIO....
- G02B:OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
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