Low coherence interferometric system for phase stepping shearography combined with 3D profilometry
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United States of America Patent
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Oct 28, 2014
Issued Date -
N/A
app pub date -
Dec 4, 2012
filing date -
Dec 5, 2011
priority date (Note) -
In Force
status (Latency Note)
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Abstract
The present invention relates to a portable industrial instrument for performing, in an integrated and two-way manner, an interferometric fringe projection and shearography, on a object to be tested, so that, when the two-way interferometer (1) is associated with the coherent or quasi-coherent projection device (2), the instrument is able to measure the 3D shape of the object by interferometric fringe projection, also known as moiré method, and, when the two-way interferometer (1) is associated with the recording or imaging device (4), the instrument is able to perform shearographic measurements on the object, the direction of the traversing light beam in the interferometer (1) being reversed when shifting from one measurement configuration to the other one.
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Patent Citation Ranking
- 3 Citation Count
- G01B Class
- 6.63 % this patent is cited more than
- 11 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Apr 28, 2026 |
