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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
BRUKER NANO INC	112 ROBIN HILL ROAD SANTA BARBARA CA 93117

International Classification(s)

• G01Q:SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIO....
• G01B:MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIME....

• 2011 Application Filing Year
• G01Q Class
• 74 Applications Filed
• 56 Patents Issued To-Date
• 75.68 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Belkin, Mikhail	Austin, US	10	112
# of filed Patents : 10 Total Citations : 112
Kjoller, Kevin	Santa Barbara, US	30	523
# of filed Patents : 30 Total Citations : 523
Lu, Feng	Austin, US	265	1220
# of filed Patents : 265 Total Citations : 1220
Prater, Craig	Santa Barbara, US	67	1053
# of filed Patents : 67 Total Citations : 1053
Raschke, Markus	Boulder, US	1	15
# of filed Patents : 1 Total Citations : 15
Yakolev, Vladislav V	College Station, US	1	15
# of filed Patents : 1 Total Citations : 15

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Patent Citation Ranking

• 15 Citation Count
• G01Q Class

• 0 % this patent is cited more than
• 11 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date
11.5 Year Payment	$7400.00	$3700.00	$1850.00	Apr 28, 2026

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge - 11.5 year - Late payment within 6 months	$160.00	$80.00	$40.00
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
October 28, 2014	US,8869602,B2   US8869602B2	GRANTED PATENT AS SECOND PUBLICATION
June 28, 2012	US,20120167261,A1   US20120167261A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8869602

High frequency deflection measurement of IR absorption

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Abstract

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An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction, typically absorption with the sample in the region of the tip. The tip may be configured to produce electric field enhancement when illuminated by a radiation source. This enhancement allows for significantly reduced illumination power levels resulting in improved spatial resolution by confining the sample-radiation interaction to the region of field enhancement which is highly localized to the tip.

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Description

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Claims

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Legal Events

 

• MAFP2022
• FEPP2018
• MAFP2018
• AS2018
• FEPP2018
• AS2018
• AS2016
• I2014
• STCF2014
• P2012
• F2011
• PD2007

Date	Code	Event	Description
Apr 20, 2022	MAFP	MAINTENANCE FEE PAYMENT	free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY year of fee payment: 8
Oct 26, 2018	FEPP	FEE PAYMENT PROCEDURE	free format text: SURCHARGE FOR LATE PAYMENT, LARGE ENTITY (ORIGINAL EVENT CODE: M1554); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY
Oct 26, 2018	MAFP	MAINTENANCE FEE PAYMENT	free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY year of fee payment: 4
Aug 29, 2018	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:ANASYS INSTRUMENTS CORP.;REEL/FRAME:046942/0185 Owner name: BRUKER NANO, INC., CALIFORNIA Effective Date: Aug 29, 2018
Jun 11, 2018	FEPP	FEE PAYMENT PROCEDURE	free format text: MAINTENANCE FEE REMINDER MAILED (ORIGINAL EVENT CODE: REM.)
Feb 07, 2018	AS	ASSIGNMENT	free format text: CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED ON REEL 038638 FRAME 0585. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT;ASSIGNORS:PRATER, CRAIG;KJOLLER, KEVIN;RASCHKE, MARKUS;SIGNING DATES FROM 20160504 TO 20160505;REEL/FRAME:045279/0930 Owner name: ANASYS INSTRUMENTS CORP, CALIFORNIA
May 18, 2016	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:PRATER, CRAIG;KJOLLER, KEVIN;RASCHKE, MARKUS;AND OTHERS;SIGNING DATES FROM 20160128 TO 20160505;REEL/FRAME:038638/0585 Owner name: ANASYS INSTRUMENTS, CALIFORNIA free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:PRATER, CRAIG;KJOLLER, KEVIN;RASCHKE, MARKUS;AND OTHERS;SIGNING DATES FROM 20160128 TO 20160505;REEL/FRAME:038638/0585 Owner name: BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM, free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:PRATER, CRAIG;KJOLLER, KEVIN;RASCHKE, MARKUS;AND OTHERS;SIGNING DATES FROM 20160128 TO 20160505;REEL/FRAME:038638/0585 Owner name: THE TEXAS A&M UNIVERSITY SYSTEM, TEXAS
Oct 28, 2014	I	Issuance
Oct 08, 2014	STCF	INFORMATION ON STATUS: PATENT GRANT	free format text: PATENTED CASE
Jun 28, 2012	P	Published
Nov 30, 2011	F	Filing
May 15, 2007	PD	Priority Date