Maintenance expert system for measuring instrument
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United States of America Patent
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Oct 14, 2014
Grant Date -
Feb 2, 2012
app pub date -
Oct 4, 2010
filing date -
Oct 9, 2009
priority date (Note) -
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status (Latency Note)
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Abstract
Provided is a measuring instrument for measuring an object to be measured, including: a CPU (9) including a plurality of internal timer counters and having a function of calculating a measured value of the object to be measured based on detection values of various sensors; a power supply circuit (3) for supplying power to the CPU (9); a detector (4) for detecting a state of the object to be measured; a display unit (5) for displaying detection input data input from the various sensors and the state of the object to be measured, which is obtained through a calculation; a real-time clock IC (RTC) (11) for measuring an elapsed time; an EEPROM (12) for storing data input to the CPU (9); and an FeRAM (13) for storing input values from the various sensors, and storing a calculation result obtained through a calculation performed by the CPU (9) based on the input values from the various sensors.
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