Method and device for testing and calibrating electronic semiconductor components which convert sound into electrical signals

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United States of America Patent

PATENT NO 8848931
APP PUB NO 20100290634A1
SERIAL NO

12810716

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Abstract

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A method for testing and calibrating electronic semiconductor components which convert sound into electrical signals acoustically irradiates the components in a sound chamber whose largest free length is less than half the wavelength of the highest frequency of the sound waves produced during the test.

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Patent Owner(s)

Patent OwnerAddress
SILICON VALLEY BANK AS ADMINISTRATIVE AGENT3003 TASMAN DRIVE HF 150 SANTA CLARA CA 95054

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Binder, Stefan Rosenheim, DE 4 9
Kiermeier, Arnfried Oberaudorf, DE 6 83
Schaule, Max Mindelheim, DE 13 82

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