Substrate damage prevention system and method

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United States of America Patent

PATENT NO 8845810
SERIAL NO

11874365

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Abstract

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A substrate damage prevention system and method for a plasma treating apparatus are provided. The system may include a lower electrode on which a substrate may be mounted, an inert gas supply unit which may supply an inert gas to an upper surface of the lower electrode on which the substrate is mounted, and an air supply unit which may supply air to the upper surface of the lower electrode. An inert gas may be supplied between the lower electrode and the substrate in order to control the temperature of the substrate during the chucking. Air may be supplied between the lower electrode and the substrate during dechucking in order to allow the substrate to be easily separated from the lower electrode.

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Patent Owner(s)

Patent OwnerAddress
ADP ENGINEERING CO LTDGYEONGKI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hwang, Young Joo Seoul, KR 4 181

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