Systems and methods for the determination of formation water resistivity and conductivity

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United States of America Patent

PATENT NO 8843319
SERIAL NO

13273980

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Abstract

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According to various embodiments, a method may include measuring a first capacitance of a sample at a first frequency using a measurement system, measuring a second capacitance of the sample at a second frequency using the measurement system, calculating a ratio of the first capacitance to the second capacitance, and determining a formation water resistivity or conductivity of the sample using the ratio.

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Patent Owner(s)

Patent OwnerAddress
CORE LABORATORIES LP6316 WINDFERN HOUSTON TX 77040

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dacy, John Houston, US 1 4
Griffin,, Jr Ted J Spring, US 5 6
Hanna, Ragheb R Cypress, US 1 4
Lee, Robert Hanna Waller, US 1 4
Martin, Paul Roger Cypress, US 1 4

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