Interferometric quasi-autocollimator
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United States of America Patent
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Sep 23, 2014
Issued Date -
N/A
app pub date -
Mar 21, 2012
filing date -
Mar 21, 2011
priority date (Note) -
In Force
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Abstract
Systems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface.

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- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
UNIVERSITY OF WASHINGTON THROUGH ITS CENTER FOR COMMERCIALIZATION | 4311 11TH AVE NE SUITE 500 SEATTLE WA 98105 |
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- [Patents Count]
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Gundlach, Jens H | Seattle, US | 34 | 177 |
Hagedorn, Charles A | Seattle, US | 1 | 4 |
Schlamminger, Stephan | Rockville, US | 5 | 5 |
Turner, Matthew D | Seattle, US | 2 | 8 |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
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