METHOD AND APPARATUS FOR CONTROL OF A PLASMA FOR SPECTROMETRY
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United States of America Patent
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Sep 2, 2014
Grant Date -
Sep 18, 2014
app pub date -
Nov 8, 2013
filing date -
Mar 15, 2013
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Abstract
A method of and apparatus for controlling the temperature of an inductively coupled or microwave induced plasma for optical emission spectrometry or mass spectrometry in which the intensities of two spectral lines of radiation emitted by the plasma are measured, and the power provided to sustain the plasma is adjusted so that the ratio of the intensities remains substantially constant.
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