Method and apparatus for inspecting sealing defect of container
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United States of America Patent
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Aug 5, 2014
Grant Date -
Oct 25, 2012
app pub date -
Nov 30, 2010
filing date -
Dec 4, 2009
priority date (Note) -
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Abstract
A method for inspecting sealing defects of a container using infrared light. Infrared light in a wavelength range of 1450 nm±20 nm is irradiated from a phototransmitter onto the sealed portion of a sample container Infrared light reflected from or transmitted through the sealed portion of the sample container is received by a photoreceiver, and transmitted to a photodetector through an optical fiber. The infrared light in a same wavelength range as the case of inspecting the sample container is irradiated onto the sealed portion of a container to be inspected. The infrared light reflected from or transmitted through the sealed portion of the inspected container is converted into the analog voltage value and transmitted to a controller. If the infrared light is reduced to be smaller than a threshold set on the basis of the sample container, the sealed portion of the inspected container is judged as a sealing defect.
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