Methods and apparatus for hybrid outlier detection
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United States of America Patent
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Jul 22, 2014
Grant Date -
Aug 29, 2013
app pub date -
Mar 29, 2013
filing date -
May 24, 2001
priority date (Note) -
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Abstract
Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
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