Marker-free chromosome screening
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United States of America Patent
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Jul 15, 2014
Grant Date -
Mar 10, 2011
app pub date -
Feb 19, 2009
filing date -
Feb 27, 2008
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Abstract
The present invention relates to a method for analyzing chromosomes through preparing a chromosome preparation, measuring at least one interference characteristic of the chromosome preparation and characterizing at least one chromosome structure by way of the interference characteristic. Also, the invention relates to the use of a near-field microscope for analyzing un-dyed chromosomes.
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