Wavelength dispersive X-ray fluorescence spectrometer

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United States of America Patent

PATENT NO 8774356
APP PUB NO 20130294577A1
SERIAL NO

13997839

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Abstract

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In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (11), when correcting a counting rate of pulses determined by a counting unit (10) on the basis of a dead time of a detector (7), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (9), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation.

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Patent Owner(s)

Patent OwnerAddress
RIGAKU CORPORATION3-9-12 MATSUBARA-CHO AKISHIMA-SHI TOKYO 1968666

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Inoue, Hisashi Takatsuki, JP 55 1126
Kataoka, Yoshiyuki Takatsuki, JP 32 265
Kawakyu, Kosuke Takatsuki, JP 3 30

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