System and method for inspection of electrical circuits

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United States of America Patent

PATENT NO 8773140
APP PUB NO 20130027050A1
SERIAL NO

13190926

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Abstract

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A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein.

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Patent Owner(s)

Patent OwnerAddress
PHOTON DYNAMICS INC17 GREAT OAKS BOULEVARD SAN JOSE CA 95119

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Jung, Sam-Soo San Jose, US 1 0
Martin, Raul San Jose, US 2 25

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