Evanescent microwave microscopy probe and methodology
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United States of America Patent
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Jun 24, 2014
Grant Date -
Jul 21, 2011
app pub date -
Jun 26, 2009
filing date -
Jun 26, 2008
priority date (Note) -
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Abstract
The present disclosure generally relates to an evanescent microwave microscopy probe and methods for making and using the same. Some embodiments relate to a probe which is constructed of silver. Other embodiments relate to a method of measuring an unknown property a target material, comprising moving the probe away from the target material, taking a first measurement, moving the probe such that it touches the target material, taking a second measurement, and comparing the first and second measurements in order to measure the unknown property.
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