High speed test circuit and method

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United States of America Patent

PATENT NO 8754656
APP PUB NO 20120229146A1
SERIAL NO

13410472

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Abstract

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A high speed test circuit receives a tester clock from a tester and it conducts a test on a circuit under test. The high speed test circuit generates a high frequency clock according to the tester clock, so it is capable of operating in two frequencies. The high speed test circuit tests the circuit under test according to the high frequency clock, and it performs a low speed operation according to a low frequency clock, which is for example the tester clock.

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Patent Owner(s)

Patent OwnerAddress
PIECEMAKERS TECHNOLOGY INCORPORATION1F NO 8-9 10TH NEIGHBORHOOD SHIN-FENG VILLAGE CYONGLIN TOWNSHIP HSIN-CHU COUNTY 30742

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tien, Li-Chin Hsinchu, TW 5 79
Ting, Tah-Kang Taipei, TW 1 2
Wang, Gyh-Bin Hsinchu, TW 24 196
Wang, Ming-Hung Hsinchu, TW 31 578
Wu, Chun-Peng Hsinchu, TW 7 12

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