Generating pulse parameters in a particle analyzer
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United States of America Patent
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Jun 17, 2014
Grant Date -
Dec 15, 2011
app pub date -
Mar 10, 2011
filing date -
Mar 10, 2010
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Abstract
A method is provided for generating measurement parameters for a particle sample in a particle analyzer. The method includes, interrogating the particle sample with a triggering interrogator and one or more secondary interrogators respectively positioned along a length of an interrogation area, generating respective pulses based upon the interrogation of a first particle from the particle sample, determining a primary pulse detection window based upon a triggering pulse, determining a search interval to find a secondary pulse based upon factors including the primary pulse detection window and a laser delay, adjusting the search interval for laser delay variation dynamically based on the interrogation of the first particle, identifying the secondary pulse in the adjusted search interval, and processing the secondary pulse to determine a peak value of the secondary pulse. Corresponding apparatus are also provided.
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