Probe tips for airborne instruments used to measure cloud microphysical parameters
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 20, 2014
Grant Date -
Apr 28, 2011
app pub date -
Jan 3, 2011
filing date -
Mar 31, 2009
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An instrument for obtaining airborne measurements of cloud microphysical parameters. The instrument comprises supporting arms mounted thereon, optics and a detector for measuring the cloud microphysical parameters The supporting arms define an optical path of the instrument and comprise probe tips affixed thereto. The probe tips comprise an outer portion and an inner portion opposite the outer portion. The inner portion of the tips may comprise an angled section having at least one angled surface shaped to deflect particles away from the optical path of the instrument.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully