Method for measuring system parameter of linear multiport and measuring method using vector network analyzer
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 13, 2014
Grant Date -
Nov 24, 2011
app pub date -
Feb 2, 2010
filing date -
Feb 4, 2009
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}−1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully