Vertical guided layered probe
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United States of America Patent
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May 13, 2014
Grant Date -
Jul 15, 2010
app pub date -
Mar 2, 2010
filing date -
Oct 19, 2007
priority date (Note) -
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Abstract
The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate surrounds the probes via the openings. The layered probes have a base end, an opposing tip end and a shaft connecting the base end to the tip end. The base end can have a positioning device that extends away from the base end.
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