MATERIAL PROPERTY GAUGES AND RELATED METHODS FOR DETERMINING A PROPERTY OF A MATERIAL
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United States of America Patent
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Apr 8, 2014
Grant Date -
Apr 10, 2014
app pub date -
Mar 11, 2013
filing date -
Aug 30, 2005
priority date (Note) -
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Abstract
The subject matter described herein includes methods, systems, and computer program products for measuring the density of a material. According to one aspect, a material property gauge includes a nuclear density gauge for measuring the density of a material. A radiation source adapted to emit radiation into a material and a radiation detector operable to produce a signal representing the detected radiation. A first material property calculation function may calculate a value associated with the density of the material based upon the signal produced by the radiation detector. The material property gauge includes an electromagnetic moisture property gauge that determines a moisture property of the material. An electromagnetic field generator may generate an electromagnetic field where the electromagnetic field sweeps through one or more frequencies and penetrates into the material. An electromagnetic sensor may determine a frequency response of the material to the electromagnetic field across the several frequencies.
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