System and method for probing work pieces
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United States of America Patent
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Mar 18, 2014
Grant Date -
Oct 28, 2010
app pub date -
Jun 27, 2008
filing date -
Jun 29, 2007
priority date (Note) -
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Abstract
A system and method of probing work pieces is described. A first and second arm each having a pivot point and a guide end are pivotally coupled together at the respective pivot points. A probe tip holder is coupled to at least one of the first arm or the second arm. A guide means guides movement of the guide ends of the pivotally coupled arms, such that movement of the guide end of the first arm and the second arm move the probe tip holder in a plane parallel to the work piece surface.
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