Device for measuring deformation of a structure and a method for measuring deformation of a structure using the same
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United States of America Patent
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Mar 18, 2014
Grant Date -
Jun 21, 2012
app pub date -
Mar 2, 2010
filing date -
Feb 27, 2009
priority date (Note) -
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Abstract
The present invention is directed to a device for measuring a deformation ratio of a structure which includes a photonic crystal layer containing nanoparticles aligned at a certain interval. The device is useful for detecting when various industrial structures are deformed by a working load. The presence of deformation and the deformation ratio in the structures may be simply and easily measured by measuring the change of structural color or magnetic flux in the device. The device may be useful to prevent accidents due to excessive deformation in structures.
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