Semiconductor-processing apparatus equipped with robot diagnostic module

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United States of America Patent

PATENT NO 8666551
APP PUB NO 20100158644A1
SERIAL NO

12341869

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Abstract

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A semiconductor wafer manufacturing apparatus is equipped with a diagnostic module for diagnosing integrity of a transfer robot. The diagnostic module is attached to one side of a semiconductor wafer transfer chamber provided with the transfer robot, which side is also used for the purpose of maintenance, for example. One or more sensors are installed in the diagnostic module so that when the transfer robot is inserted into the diagnostic module, the position or shape of each end effector of the transfer robot is detected and compared against a pre-registered normal condition, thereby diagnosing the integrity of the end effector of the transfer robot, while performing wafer processing.

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Patent Owner(s)

Patent OwnerAddress
ASM JAPAN K K23-1 6-CHOME NAGAYAMA TAMA-SHI TOKYO 206-0025

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishino, Teruhide Yokohama, JP 4 25
Takizawa, Masahiro Nagaoka, JP 106 2380

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