Multi-domain execution of tests on electronic devices
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United States of America Patent
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Feb 11, 2014
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N/A
app pub date -
Sep 12, 2006
filing date -
Dec 21, 2004
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Abstract
A device under test is divided into multiple test domains, and test conditions for each of the multiple test domains are defined separately, so that each test domain has its own test pattern, timing data, and other test conditions. Each test domain can start and stop independently, and run at different speeds. Further, triggers are used to specify how the tests executed in the different test domains interact and communicate with one another. Any test domain can generate or wait for a trigger from any other test domain. A test domain can wait for a trigger from a test domain in a CPU.
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