Device and method of examining absorption of infrared radiation
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Feb 4, 2014
Grant Date -
Jun 2, 2011
app pub date -
Jul 21, 2009
filing date -
Jul 22, 2008
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A light absorption examining device includes a laser light source that emits the pulse laser beam, a measuring unit that retains the measuring object and irradiates the measuring object with the pulse laser beam, a light receiving unit that receives the pulse laser beam transmitted through the measuring object and outputs a light receiving signal, a pulse generator that produces a single rectangular pulse at a time when a signal level of the light receiving signal output from the light receiving unit intersects a set threshold, a laser driver that supplies the produced rectangular pulse to the laser light source to emit the pulse laser beam, and a control/processing unit that determines an accumulated delay time and examines absorption of the pulse laser beam by the measuring object using the determined accumulated delay time, the accumulated delay time representing a delay in a production timing of the rectangular pulse.
First Claim
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Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
---|---|---|---|---|---|
WO | A1 | WO2010010684 | Jul 21, 2009 | Patent | Application |
INTERNATIONAL APPLICATION PUBLISHED WITH INTERNATIONAL SEARCH REPORT | 赤外線吸収検査装置および赤外線吸収検査方法 | Jan 28, 2010 | |||
JP | B1 | JP4392850 | Jul 21, 2009 | Patent | Grant |
PUBLISHED GRANTED PATENT | 赤外線吸収検査装置および赤外線吸収検査方法 | Jan 06, 2010 |
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
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MITSUI ENGINEERING & SHIPBUILDING CO LTD | CHUO-KU TOKYO 104-8439 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Kimura, Noriaki | Tamano, JP | 29 | 104 |
# of filed Patents : 29 Total Citations : 104 |
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
---|---|---|---|---|
11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Aug 4, 2025 |
Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge - 11.5 year - Late payment within 6 months | $160.00 | $80.00 | $40.00 |
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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Legal Events
Date | Code | Event | Description |
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Mar 19, 2018 | STCH | INFORMATION ON STATUS: PATENT DISCONTINUATION | free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |
Mar 19, 2018 | LAPS | LAPSE FOR FAILURE TO PAY MAINTENANCE FEES | free format text: PATENT EXPIRED FOR FAILURE TO PAY MAINTENANCE FEES (ORIGINAL EVENT CODE: EXP.) |
Feb 18, 2018 | FP | LAPSED DUE TO FAILURE TO PAY MAINTENANCE FEE | Effective Date: Feb 18, 2018 |
Oct 02, 2017 | FEPP | FEE PAYMENT PROCEDURE | free format text: MAINTENANCE FEE REMINDER MAILED (ORIGINAL EVENT CODE: REM.) |
Oct 05, 2016 | AS | ASSIGNMENT | free format text: CHANGE OF NAME;ASSIGNOR:CITIZEN HOLDINGS CO., LTD.;REEL/FRAME:041479/0804 Owner name: CITIZEN WATCH CO., LTD., JAPAN Effective Date: Oct 05, 2016 |
Dec 02, 2014 | FEPP | FEE PAYMENT PROCEDURE | free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
Feb 18, 2014 | I | Issuance | |
Jun 18, 2009 | P | Published | |
Feb 28, 2008 | AS | ASSIGNMENT | free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SHIMIZU, HIDEKI;KASAI, TSUNEHARU;REEL/FRAME:020758/0969 Owner name: CITIZEN HOLDINGS CO., LTD., JAPAN Effective Date: Feb 28, 2008 |
Sep 05, 2006 | F | Filing | |
Sep 27, 2005 | PD | Priority Date |

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