Method for fabricating magnetic tunnel junction device

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United States of America Patent

PATENT NO 8642358
APP PUB NO 20130034917A1
SERIAL NO

13315011

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Abstract

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A method for fabricating a semiconductor device includes forming a plurality of layers which are stacked as a bottom layer, an MTJ layer, and a top layer, patterning the top layer and the MTJ layer using an etch mask pattern to form a top layer pattern and an MTJ pattern, forming a carbon spacer on the sidewalls of the MTJ pattern and the top layer pattern to protect the MTJ pattern and the top layer pattern, and patterning the bottom layer using the carbon spacer and the etch mask pattern as an etch mask to form a bottom layer pattern.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG SEMICONDUCTOR INC3655 NORTH FIRST STREET SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Min Suk Seongnam-si, KR 39 256

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