Scanning temporal ultrafast delay and methods and apparatuses therefor
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United States of America Patent
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Jan 14, 2014
Grant Date -
Jan 10, 2013
app pub date -
Aug 2, 2012
filing date -
Apr 1, 1994
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Abstract
Methods and apparatuses for performing temporal scanning using ultra-short pulse width lasers in which only minimal (micro-scale) mechanical movement is required, and related methods for obtaining high-accuracy timing calibration, on the order of femtoseconds, are disclosed. A dual laser system is disclosed in which the cavity of one or more of the lasers is dithered using a piezoelectric element. A Fabry-Perot etalon generates a sequence of timing pulses used in conjunction with a laser beam produced by the laser having the dithered laser cavity. A correlator correlates a laser pulse from one of the lasers with the sequence of timing pulses to produce a calibrated time scale. The invention is applicable to applications requiring rapid scanning and time calibration, including metrology, characterization of charge dynamics in semiconductors, electro-optic testing of ultrafast electronic and optoelectronic devices, optical time domain reflectometry, and electro-optic sampling oscilloscopes.
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