Non-volatile memory cell structure and a method of fabricating the same

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United States of America Patent

PATENT NO 8629032
APP PUB NO 20120181595A1
SERIAL NO

13008407

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Abstract

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A non-volatile memory cell structure and a method of fabricating the same. The method comprising the steps of: fabricating a portion of a floating gate from one or more first metal local interconnection layer (LIL) slit contacts deposited on a patterned dielectric layer; and fabricating a portion of a control gate from one or more second metal LIL slit contacts deposited on the patterned dielectric layer; wherein the first and second metal LIL slit contacts form a capacitive structure between the floating gate and the control gate.

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Patent Owner(s)

Patent OwnerAddress
SYSTEMS ON SILICON MANUFACTURING CO PTE LTD70 PASIR RIS INDUSTRIAL DRIVE 1 SINGAPORE 519527

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Inventor Name Address # of filed Patents Total Citations
Huang, Sheng He Singapore, CN 5 3

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