Terahertz scanning reflectometer
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United States of America Patent
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Dec 31, 2013
Grant Date -
Sep 13, 2012
app pub date -
Mar 16, 2012
filing date -
Sep 27, 2006
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Abstract
A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
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