Measuring station for high-gloss surfaces
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 24, 2013
Grant Date -
Aug 18, 2011
app pub date -
Feb 16, 2009
filing date -
Feb 18, 2008
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method is disclosed for measuring a profile of a reflecting face of an end (2) of a pipe section. An electrical field is generated between the face and suspended particles (19) in the ambient air of the face. The particles (19) are attracted to the face by the electrical field and matt-finishing the face. The face is then sensed with a laser beam (16) and scattered light (17) is reflected by the face and measured by a sensor (11), thereby determining a face profile.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully