Non-destructive thickness measurement systems and methods
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United States of America Patent
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Dec 3, 2013
Grant Date -
Jul 1, 2010
app pub date -
Dec 30, 2008
filing date -
Dec 30, 2008
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Abstract
The present invention generally relates to improved non-destructive thickness measurement systems and methods. Embodiments of the present invention utilize quarter wave resonant frequency to measure the thickness of high-temperature pipe walls. In one embodiment, an improved non-destructive thickness measurement system is provided that utilizes Gaussian white noise to produce maximum mechanical resonance in the pipe wall and laser vibrometers to detect the pipe wall's maximum displacement.
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