System and method for improved testing of electronic devices
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 3, 2013
Grant Date -
Nov 10, 2011
app pub date -
May 4, 2010
filing date -
May 4, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully