Transmission-modulated photoconductive decay measurement system
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United States of America Patent
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Nov 12, 2013
Grant Date -
Nov 11, 2010
app pub date -
Jan 27, 2010
filing date -
Jan 27, 2009
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Abstract
A system and method for measuring recombination lifetime of a photoconductor or semiconductor material in real time and without physically contacting the material involving positioning the sample material between a transmitter and a receiver so that electromagnetic signals, preferably radio frequency signals, traveling from the transmitter to the receiver pass through the sample material. The electromagnetic signals are modulated as they pass through the sample material depending on the carrier density and conductivity of the sample material. The modulated electromagnetic signals received by the receiver are then analyzed to determine the carrier recombination lifetime of the sample material.
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