Method for high efficiency tandem mass spectrometry

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United States of America Patent

PATENT NO 8581176
APP PUB NO 20110127419A1
SERIAL NO

12788403

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Abstract

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A system and method for performing MS/MS of everything are provided. Ionisable materials separated in order of molecular weight in a plurality of mass ranges are received at a mass spectrometer system in a given order in time, each mass range comprising a respective center mass value and a respective width. The ionisable materials are ionised in the given order that each of the plurality of mass ranges are received, to form respective precursor ions in a respective given mass range. The respective precursor ions are filtered via a mass filter module, a mass scan range of the mass filter module synchronized with the given order in which each of the plurality of mass ranges are received. The respective precursor ions are fragmented, via a fragmentation module, to form respective product ions. The respective product ions are analyzed in a mass spectrometer module to produce product ion spectra.

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Patent Owner(s)

Patent OwnerAddress
MDS ANALYTICAL TECHNOLOGIES A BUSINESS UNIT OF MDS INC71 FOUR VALLEY DRIVE CONCORD ONTARIO K4K 4V8
APPLIED BIOSYSTEMS INC850 LINCOLN CENTRE DRIVE FOSTER CITY CALIFORNIA 94404

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ackloo, Suzanne Whitby, CA 2 32
Thomson, Bruce Toronto, CA 22 435

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