Device for optoelectronically characterizing samples

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United States of America Patent

PATENT NO 8580194
APP PUB NO 20100202922A1
SERIAL NO

12312767

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Abstract

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Device (1) for optoelectronically characterizing samples by means of electrochemiluminescence (ECL), in which an electric voltage applied across a counter electrode (6) and a working electrode (2) on which the sample spots are disposed excites the sample to luminescence and a reading of the luminescence is taken using an optoelectronic component, characterized in that the optoelectronic component comprises an image detection component (4) with a photoactive layer (10) made from organic semiconductors between two electrode layers (11,14).

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Patent Owner(s)

Patent OwnerAddress
ASMAG-HOLDING GMBHHECKENAU 34 GRÜNAU IM ALMTAL 4645

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sonnleitner, Max Linz, AT 9 29

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