Multimeter having clamping means for test probe
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United States of America Patent
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Oct 29, 2013
Grant Date -
Feb 7, 2013
app pub date -
Aug 7, 2011
filing date -
Aug 7, 2011
priority date (Note) -
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status (Latency Note)
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Abstract
A multi-meter for a test probe includes a main body, two test probes and a clamping means. The test probe includes a test pin, a connecting portion, and a lead electrically connected between the test pin and the connecting portion. The connecting portion is inserted into the main body and electrically thereto. The clamping means comprises a liftable cover and a clamping portion formed on the liftable cover. One end of the liftable cover is pivotally connected to the main body. The clamping portion is configured to clamp the test pin. By this structure, the test pin is clamped by the camping portion to help a user carrying out the measurement.
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