Wafer fabrication process

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United States of America Patent

PATENT NO 8562749
APP PUB NO 20120231397A1
SERIAL NO

13475997

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Abstract

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A wafer fabrication process with removal of haze formation from a pellicalized photomask surface is provided. The wafer fabrication process includes pre-print wafer processing, wafer print processing using at least one photomask having a pellicle, photomask clean processing, wafer print processing using the photomask, and post-print wafer processing. The photomask clean processing step includes directing a laser through the pellicle towards an inorganic particle disposed on the photomask to remove the particle from the photomask by thermal decomposition.

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Patent Owner(s)

Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD SANTA BARBARA CA 93117

International Classification(s)

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Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2012201320142015201620172018201920200255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brinkley, David Baltimore, US 19 78
LeClaire, Jeffrey E Boca Raton, US 24 120
Roessler, Kenneth G Boca Raton, US 14 111

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Patent Citation Ranking

  • 1 Citation Count
  • B08B Class
  • 8.06 % this patent is cited more than
  • 12 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges45383792886512101 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8091 - 1000255075100125150175200225250275300325350375400425

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11.5 Year Payment $7400.00 $3700.00 $1850.00 Apr 22, 2025