Opener for test handler
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United States of America Patent
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Oct 15, 2013
Grant Date -
Nov 3, 2011
app pub date -
Apr 11, 2011
filing date -
Apr 30, 2010
priority date (Note) -
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status (Latency Note)
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Abstract
An opener for a test handler is provided. Even when holding members of inserts of a carrier board are manipulated to release semiconductor devices that have been in a held state, a predetermined distance can remain between an upper surface of the opening plate and a lower surface of the insert, thus preventing the inserts from becoming defective.
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