All-optical method and system for generating ultrashort charged particle beam

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United States of America Patent

PATENT NO 8558199
APP PUB NO 20130161539A1
SERIAL NO

13724379

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Abstract

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A method for generating an ultrashort charged particle beam, comprising creating a high intensity longitudinal E-field by shaping and tightly focusing, in an on-axis geometry, a substantially radially polarized laser beam, and using the high intensity longitudinal E-field for interaction with a medium to accelerate charged particles.

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Patent Owner(s)

Patent OwnerAddress
PICHE MICHEL1516 JACQUES MEILLEUR QUEBEC QUEBEC G1K 3K5

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fourmaux, Sylvain Montreal, CA 5 9
Kieffer, Jean-Claude Montreal, CA 9 29
MacLean, Jean-Philippe Saint-Lambert, CA 1 5
Payeur, Stephane Montreal, CA 3 6
Piche, Michel Quebec, CA 5 59
Tchervenkov, Christopher Brossard, CA 2 5

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