Method for calibrating a thickness gauge

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United States of America Patent

PATENT NO 8554503
APP PUB NO 20110125442A1
SERIAL NO

12992993

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Abstract

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A method for calibration of a thickness gauge is provided in which the thickness gauge measures the thickness of a measured object in a stipulated measurement direction with at least one displacement sensor, operating contactless or by scanning, a reference object with known thickness and shape being brought into at least one partial area of the measurement field of the at least one displacement sensor.

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Patent Owner(s)

Patent OwnerAddress
MICRO-EPSILON MESSTECHNIK GMBHKONIGBACHER STRASSE 15 ORGENBURG D-94496

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schallmoser, Günter Ruhstorf, DE 3 11
Wagner, Robert Neuburg am Inn, DE 67 1235
Wisspeintner, Karl Ortenburg, DE 13 221

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