Probe block
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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Oct 1, 2013
Issued Date -
N/A
app pub date -
Feb 22, 2010
filing date -
Feb 26, 2009
priority date (Note) -
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Abstract
There is provided a probe block comprising a probe including first contact portions, second contact portions, and beams connecting the first contact portion to the second contact portion and a guide where the probe is inserted and supported, wherein the probe block is installed in a probe card for inspecting a semiconductor chip.
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