Method for manufacturing magnetic storage device and magnetic storage device

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United States of America Patent

PATENT NO 8546151
APP PUB NO 20100264501A1
SERIAL NO

12528854

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Disclosed is a method for manufacturing a magnetic storage device comprising a TMR element, which comprises a step for forming an insulting film on an interlayer insulating film provided with a wiring layer, an opening formation step for forming an opening in the insulating film so that the wiring layer is exposed therefrom, a metal layer formation step for forming a metal layer on the insulating layer so that the opening is filled therewith, a CMP step for polishing and removing the metal layer on the insulating layer by a CMP method and forming the metal layer remaining in the opening into a lower electrode, and a step for forming a TMR element on the lower electrode. Also disclosed is a magnetic storage device comprising an interlayer insulating film provided with a wiring layer, an insulating film formed on the interlayer insulating film, an opening formed in the insulating film so that the wiring layer is exposed therefrom, a barrier metal layer provided so as to cover the inner surface of the opening, a lower electrode formed on the barrier metal so as to fill the opening, and a TMR element formed on the lower electrode.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG SEMICONDUCTOR INC3655 NORTH FIRST STREET SAN JOSE CA 95134

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Eugene Milpitas, US 146 10633
Fukumura, Tatsuya Tokyo, JP 23 130
Furuta, Haruo Tokyo, JP 23 385
Huai, Yiming Milpitas, US 209 16046
Kuroiwa, Takeharu Tokyo, JP 42 709
Matsuda, Ryoji Tokyo, JP 22 159
Ueno, Shuichi Tokyo, JP 56 896
Wang, Lien-Chang Milpitas, US 45 3729

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