Apparatus and methods for measuring a material property

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United States of America Patent

PATENT NO 8539844
APP PUB NO 20120297896A1
SERIAL NO

13116139

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Abstract

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The present invention provides a method for producing a measurement apparatus for measuring a material property. The method includes steps of (a) providing a pressure sensing component having a first and a second surfaces; (b) disposing a first and a second electrodes on the first surface; and (c) disposing an elastic member having a first and a second portions on the first surface, wherein the first and the second portions of the elastic material have different values of an elastic coefficient, and cover the first and the second electrodes, respectively.

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Patent Owner(s)

Patent OwnerAddress
SOUTHERN TAIWAN UNIVERSITYNO 1 NANTAI ST YUNG-KANG CITY TAINAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chuang, Cheng-Hsin Tainan, TW 14 48
Liou, Yi-Rong Tainan, TW 3 15

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