Method for recognizing a structure to be applied to a substrate, with the aid of several cameras and device therefore

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United States of America Patent

PATENT NO 8538125
APP PUB NO 20120039524A1
SERIAL NO

10584196

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Abstract

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A method and apparatus are provided for automatic application and monitoring of a structure to be applied onto substrate. A plurality of cameras positioned around an application facility are utilized to monitor the automatic application of a structure on a substrate by means of a stereometry procedure. Three-dimensional recognition of a reference contour position results in the overlapping area to be used for gross adjustment of the application facility prior to applying the structure.

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Patent Owner(s)

Patent OwnerAddress
QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBHLILIENTHALSTRASSE 5 PUCHHEIM 82178

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Berger, Mirko München, DE 3 40
Linnenkohl, Jan Anders Bensheim, DE 4 42
Raab, Roman München, DE 7 72
Tomtschko, Andreas Weinsberg, DE 3 40

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